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F.  Galli, Ritacco, A., Lanciano, G., Vannocci, M., Colla, V., and Vannucci, M., ?Self-supervised pre-training of CNNs for flatness defect classification in the steelworks industry?, International Journal of Advances in Intelligent Informatics, vol. 6, pp. 13?22, 2020.\par \par G.  Lanciano, Ritacco, A., Cucinotta, T., Vannucci, M., Artale, A., Basili, L., Sposato, E., and Barata, J., ?SOM-Based Behavioral Analysis for Virtualized Network Functions?, in Proceedings of the 35th Annual ACM Symposium on Applied Computing, New York, NY, USA, 2020.\par \par }